Single-vendor test cells that integrate test and handling, with true test capability of 32 devices in parallel, are an answer to the relentless pressure to drastically reduce the cost of the wafer- and final- test of MEMS, while addressing the increasing test requirements.
Tags: ATE, Automatic, Test, SPEA, Automation, Semiconductor, Handler, P&P, Pick, Place, Package, MEMS, Cell, Accelerometer, Gyroscope, Pressure, Magnet, Microphone, Luciano, Bonaria
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